Challenges of time domain measurement of field-field correlation for complex PCBs
Challenges of time domain measurement of field-field correlation for complex PCBs
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复杂 PCB 场场相关性时域测量的挑战
DOI：
10.1109/isemc.2015.7256294
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发表时间：
2015
期刊：
影响因子：
--
通讯作者：
G. Tanner
中科院分区：
文献类型：
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作者：
C. Smartt;D. Thomas;H. Nasser;M. Baharuddin;G. Gradoni;S. Creagh;G. Tanner
时域中场-场相关性的测量可用于表征复杂源的随机宽带发射。开发了双探头扫描测量系统，用于对两个此类源的近场随机发射进行采样：具有矩形孔径的混响室和通用印刷电路板 (PCB)。我们表明，测量的场数据可以用于数值波传播方案来预测封装器件中和辐射的随机场。
Measurements of field-field correlation in the time domain can be used to characterize stochastic broadband emissions from complex sources. A two-probe scanning measurement system is developed and used to sample the stochastic emissions in the near-field of two such sources: a reverberation chamber with a rectangular aperture and a generic printed circuit board (PCB). We show that measured field data can be utilized in numerical wave propagation schemes to predict the stochastic fields in and radiated from a packaged device.