Development of High-Resolution Imaging of Solid–Liquid Interface by Frequency Modulation Atomic Force Microscopy
Development of High-Resolution Imaging of Solid–Liquid Interface by Frequency Modulation Atomic Force Microscopy
复制标题
调频原子力显微镜固液界面高分辨率成像的发展
DOI：
10.1143/jjap.49.08lb12
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发表时间：
2010
影响因子：
1.5
通讯作者：
Hirofumi Yamada
中科院分区：
文献类型：
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作者：
Katsuyuki Suzuki;S. Kitamura;Shukichi Tanaka;K. Kobayashi;Hirofumi Yamada
液体环境中使用的高分辨率成像技术涉及具有调频（FM）检测技术的动态模式原子力显微镜（AFM），是在商用原子力显微镜（AFM）设备的基础上新开发的，由于液体中的流体动力阻尼导致Q因数大幅下降，这通常是极其困难的。通过各种改进和优化，改进后的偏转传感器在液体中的噪声密度为29 fm/√Hz (f0 = 141 kHz)。此外，FM 检波器的噪声水平和带宽分别提高至 6 mHz/√Hz 和 6 kHz。在空气中，热漂移在足够长的时间内成功调节到小于 1 nm/min，无需任何特殊的空调处理。结果，我们成功获得了缓冲溶液中聚丙烯片、Au 薄膜和 DNA 结构的高分辨率图像。因此，液体环境被证明适合超高真空（UHV）条件下的FM-AFM高分辨率成像。
The high-resolution imaging technique used in liquid environments involving dynamic mode atomic force microscopy (AFM) with a frequency modulation (FM) detection technique has been newly developed on the basis of a commercial atomic force microscopy (AFM) apparatus, which is, generally, extremely difficult because of the large decrease in Q-factor caused by hydrodynamic damping in liquids. Through various improvements and optimization, the noise density of the improved deflection sensor was 29 fm/√Hz (f0 = 141 kHz) in liquid. In addition, the noise level and bandwidth of the FM detector were improved to 6 mHz/√Hz and 6 kHz, respectively. Thermal drift was successfully regulated at less than 1 nm/min in air for a sufficiently long time without any special air conditioning treatments. As a result, we succeeded in obtaining high-resolution images of polypropylene sheet, Au thin film, and DNA structures in a buffer solution. Therefore, liquid environments are proved to be suitable for high-resolution imaging by FM-AFM under ultrahigh vacuum (UHV) condition.
通过 5-Carboxyvinyl-2-deixyurudine 模板定向光连接构建耐热 DNA Tile 阵列
DOI：
--
发表时间：
2007
期刊：
Nucleic Acids Research 21
影响因子：
--
作者：
T. Arakawa;T. Kawahara;T. Akiyama and S. Yamada;Kenzo Fujimoto;Kenzo Fujimoto;Kenzo Fujimoto;Shinzi Ogasawara;Yoshinaga Yoshimura;Shinzi Ogasawara;Takehiro Ami;Miho Tagawa
通讯作者：
Miho Tagawa