EUV discharge light source based on a dense plasma focus operated with positive and negative polarity
EUV discharge light source based on a dense plasma focus operated with positive and negative polarity
复制标题
基于正负极性操作的密集等离子体焦点的 EUV 放电光源
DOI:
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发表时间:
2004
期刊:
影响因子:
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通讯作者:
W. Partlo
中科院分区:
文献类型:
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作者:
I. Fomenkov;N. Bowering;C. Rettig;S. Melnychuk;I. Oliver;J. Hoffman;O. Khodykin;Richard M. Ness;W. Partlo
The application of a dense plasma focus pinch discharge as a light source for extreme ultraviolet (EUV) lithography is discussed. For operation with xenon gas, the radiation emitted at around 13.5 nm is analysed with temporal, spectral or spatial resolution. We describe and compare the operating characteristics and plasma dynamics of the device when energized at positive and negative polarity of the charging voltage. The thermal load distribution, heat deposition and wear of the electrodes are measured and compared for both configurations. High-repetition rate burst mode data show characteristic transients. Source size data are also obtained when tin powder is used as the target element. More favourable performance characteristics were generally obtained for operation of the pinch discharge at negative polarity.