Enhancement of SAW laser probe measurements by signal processing
Enhancement of SAW laser probe measurements by signal processing
复制标题
通过信号处理增强 SAW 激光探头测量
DOI:
10.1109/ultsym.1999.849389
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发表时间:
1999
期刊:
影响因子:
--
通讯作者:
A. Rønnekleiv
中科院分区:
文献类型:
--
作者:
H. Engan;A. Rønnekleiv
Many different types of the SAW laser probe have been used for several years to characterize SAW devices as well as inherent properties of particular materials. Our laser probe is of a modified knife-edge type. Operating with a linear response, it has a high dynamic range. The probe provides full phasor information of the detected signal, and directional properties of the detection process makes it possible to determine the surface tilt components in two spatially orthogonal directions. We first sum up the basic characteristics of the probe. We show several examples where we take advantage of these features combined with signal processing techniques such as the fast Fourier transform. This enables us to concentrate on distinct properties of the devices under test. We thus exploit the spatial frequency domain and, in the basic detection process, the directions of the wavecrests, to enhance measurements of particular properties. Examples include results obtained from measurements on a selection of components containing various structures.