A Single Etch-Step Fabrication-Tolerant Polarization Splitter

A Single Etch-Step Fabrication-Tolerant Polarization Splitter
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DOI:
10.1109/jlt.2006.890430
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发表时间:
2007-04
影响因子:
4.7
通讯作者:
L. M. Augustin;Jos J. G. M. van der Tol;R. Hanfoug;W. Laat;Michael J. E. van de Moosdijk;Paul W. L. van Dijk;Y. Oei;M. Smit
L. M. Augustin;Jos J. G. M. van der Tol;R. Hanfoug;W. Laat;Michael J. E. van de Moosdijk;Paul W. L. van Dijk;Y. Oei;M. Smit
中科院分区:
工程技术2区
文献类型:
--
作者:
L. M. Augustin;Jos J. G. M. van der Tol;R. Hanfoug;W. Laat;Michael J. E. van de Moosdijk;Paul W. L. van Dijk;Y. Oei;M. Smit

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A tolerant single etch-step passive polarization splitter on InP/InGaAsP is designed and fabricated. The device consists of a directional coupler with a wide and a narrow waveguide. Modal birefringence of the third-order modes for transverse electric (TE) and transverse magnetic (TM) polarizations is employed to selectively couple one polarization. Tapering is applied to increase the tolerances. The devices are characterized, and the measurement results show good agreement with the beam-propagation-method simulations: a splitting ratio larger than 95% for a width range of around 100 nm and over a large wavelength range, covering at least the C-band