Fault diagnosis for physical defects of unknown behaviors

Fault diagnosis for physical defects of unknown behaviors
复制标题

未知行为的物理缺陷的故障诊断

DOI:
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发表时间:
2003
期刊:
2003 Test Symposium
影响因子:
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通讯作者:
K. Kinoshita
K. Kinoshita
中科院分区:
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文献类型:
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作者:
X. Wen;H. Tamamoto;K. Saluja;K. Kinoshita

文献摘要

被引文献

相似文献

提出了一种利用X符号对未知行为的物理缺陷进行故障诊断的X故障模型。提出了一种有效的X故障模拟方法和一种有效的X故障诊断推理方法。在此基础上,提出了一种X故障诊断方法,以提高对复杂集成电路中各种物理缺陷的故障分析能力。
This paper proposes an X-fault model for fault diagnosis of physical defects with unknown behaviors by using X symbols. An efficient X-fault simulation method and an efficient X-fault diagnostic reasoning method are presented. Based on these, an X-fault diagnosis method is described to improve the failure analysis for a wide range of physical defects in complex IC circuits.