Resonant Inelastic X-ray Scattering of Molybdenum Oxides and Sulfides

Resonant Inelastic X-ray Scattering of Molybdenum Oxides and Sulfides
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钼氧化物和硫化物的共振非弹性 X 射线散射

DOI:
10.1021/jp509376q
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发表时间:
2015
期刊:
The Journal of Physical Chemistry C
影响因子:
--
通讯作者:
Thomas R
Thomas R
中科院分区:
--
文献类型:
--
作者:
Thomas R

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用共振非弹性x射线散射(RIXS)研究了钼氧化物和硫化物。与传统的x射线吸收近边缘结构(XANES)相比,2p3/23d Mo RIXS平面具有丰富的光谱信息。用FEFF9对光谱进行了模拟,得到了较好的一致性和详细的电子信息。参考物质作为广泛的化合物的详细电子和几何研究的起点。特别是,这可以提供对未知和不断变化的材料(如催化材料)的性质和性能的见解。
Molybdenum oxides and sulfides were studied using resonant inelastic X-ray scattering (RIXS). The 2p3/23d Mo RIXS planes show a rich structure with considerably more spectral information than in conventional X-ray absorption near edge structure (XANES) spectroscopy. The spectra were simulated using FEFF9 giving generally good agreement and detailed electronic information can be derived. The reference materials serve as a starting point for detailed electronic and geometric investigations of a broad range of compounds. In particular, this can provide insights in the properties and performance of unknown and changing materials like those in catalysis.
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