Experimental characterization and mitigation of specimen charging on thin films with one conducting layer
Experimental characterization and mitigation of specimen charging on thin films with one conducting layer
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DOI：
10.1017/s143192760404067x
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发表时间：
2004-12-01
影响因子：
2.8
通讯作者：
Glaeser, RM
中科院分区：
文献类型：
--
作者：
Downing, KH;McCartney, MR;Glaeser, RM
样品充电可能是最重要的因素之一，有助于在低温电子显微镜的高变异性和一般低质量的图像。了解标本收费的性质，可以帮助设计，方法，以减少甚至避免其影响，从而提高数据收集的速度以及数据的质量。我们描述了一系列的实验，有助于表征充电现象，这被称为贝里曼效应。电荷模式的积累和消失的模式导致了如何减轻影响的几个建议。实验证明这种电荷缓解的可行性。
Specimen charging may be one of the most significant factors that contribute to the high variability and generally low quality of images in cryo-electron microscopy. Understanding the nature of specimen charging, can help in devising, methods to reduce or even avoid its effects and thus improve the rate of data collection as well as the quality of the data. We describe a series of experiments that help to characterize the charging phenomenon, which has been termed the Berriman effect. The pattern of buildup and disappearance of the charge pattern has led to several suggestions for how to alleviate the effect. Experiments are described that demonstrate the feasibility of such charge mitigation.