Ab initio study of the critical thickness for ferroelectricity in ultrathin Pt/PbTiO3/Pt films
Ab initio study of the critical thickness for ferroelectricity in ultrathin Pt/PbTiO3/Pt films
复制标题
DOI:
10.1103/physrevb.74.060101
复制
发表时间:
2006-08
影响因子:
3.7
通讯作者:
Y. Umeno;B. Meyer;C. Elsasser;P. Gumbsch
中科院分区:
文献类型:
--
作者:
Y. Umeno;B. Meyer;C. Elsasser;P. Gumbsch