Electronic relaxation and vibrational dynamics in a thiophene oligomer studied under the same experimental condition with a sub-5 fs laser
Electronic relaxation and vibrational dynamics in a thiophene oligomer studied under the same experimental condition with a sub-5 fs laser
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在相同实验条件下使用亚 5 飞秒激光器研究噻吩低聚物中的电子弛豫和振动动力学
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发表时间：
2008
期刊：
影响因子：
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通讯作者：
Takayoshi Kobayashi
中科院分区：
文献类型：
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作者：
Zhuan Wang;Takayoshi Kobayashi
利用低于5 ps的脉冲激光，对一种喹啉并噻吩衍生物进行了泵浦-探测实验，用相同的实验数据阐明了电子驰豫和振动动力学。由数据确定最低电子激发态的两个布居衰变时间分别为2 0 0 f s和1.8 ps，这可以用21Ag态位于激子11Bu态以下的假设和很低的荧光量子效率来解释.研究了泵浦脉冲激发后的弛豫过程：11Bu→11B*u→21Ag→11Ag。根据实验数据，讨论了能级的位置。利用“负时间”范围内的数据，确定了电子退相时间为±4 /s。从相应的傅里叶功率谱宽度测得频率为1466 cm-1的最强耦合模的振动退相时间常数为520±20 fs。
Using a sub-5 fs pulse laser, the pump–probe experiment was performed on a quinoid thiophene derivative and both electronic relaxation and vibrational dynamics were clarified with the same experimental data. From the data, two population decay times of the lowest electronic excited state were determined to be 200 fs and 1.8 ps, which can be explained by the assumption that the 21Ag state lies below the exciton 11Bu state together with the very low fluorescence quantum efficiency. The relaxation process after excitation by the pump pulse was studied to be 11Bu→11B*u→21Ag→11Ag. According to the experimental data, the location of the energy level was also discussed. The electronic dephasing time was determined to be 64 ± 4 fs by utilizing the data in the ‘negative time’ range. The vibrational dephasing time constant of the most strongly coupled mode with frequency of 1466 cm-1 was determined to be 520 ± 20 fs from the widths of the corresponding Fourier power spectra.