Source/Load-Pull Characterisation of GaN on Si HEMTs with Data Analysis Targeting Doherty Design
Source/Load-Pull Characterisation of GaN on Si HEMTs with Data Analysis Targeting Doherty Design
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通过针对 Doherty 设计的数据分析对 Si HEMT 上的 GaN 进行源/负载牵引表征
DOI:
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发表时间:
2020
期刊:
影响因子:
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通讯作者:
V. Camarchia
中科院分区:
文献类型:
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作者:
R. Quaglia;A. Piacibello;F. Costanzo;R. Giofré;M. Casbon;R. Leblanc;V. Valenta;V. Camarchia
This paper presents the source/load-pull characterisation of GaN HEMTs on Si substrate, with an analysis of the measurement data oriented to aid the design of Doherty power amplifiers for satellite communication applications in the 17–20 GHz band. In particular, fundamental load-pull, in both class AB and C, is used to identify the output power and efficiency contours and assess the scalability of the performance vs. device size. Second harmonic source/load-pull data is used to determine the harmonic impedance regions to avoid during matching network synthesis. The load-pull data allows to predict the optimum load modulation trajectory to be synthesised in the design phase and the associated performance in terms of efficiency, gain compression and phase distortion.