Modeling of the static tool influence function of bonnet polishing based on FEA
Modeling of the static tool influence function of bonnet polishing based on FEA
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DOI：
10.1007/s00170-014-6004-3
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发表时间：
2014-09-01
影响因子：
3.4
通讯作者：
Xu, Q.
中科院分区：
文献类型：
--
作者：
Wang, C.;Wang, Z.;Xu, Q.
研究了发动机缸盖抛光静态刀具影响函数的数学模型。对倾斜抛光静态刀具影响函数(Stif(T))、离散进动静态刀具影响函数(Stif(D))和连续进动静态刀具影响函数(Stif(C))进行了数学建模。基于有限元分析(FEA)技术，确定了接触区的压力分布。为了验证STIF模型的准确性，进行了一系列的抛光斑点提取实验。同时，研究了STIF(D)与STIF(C)的区别。结果表明，Stif(D)和Stif(C)的去除深度基本相同，可以用离散进动抛光代替连续进动抛光，以方便实际抛光过程的控制，特别是对非球面的抛光。
The purpose of this paper is to investigate the model of the static tool influence function (sTIF) of bonnet polishing (BP). Three kinds of sTIF are mathematically modeled, which are static tool influence function of tilted polishing (sTIF(t)), static tool influence function of discrete precession polishing (sTIF(d)), and static tool influence function of continuous precession (sTIF(c)), respectively. Pressure distribution in the contact area is confirmed based on finite element analysis (FEA) technology. A group of experiments to extract the polishing spots have been conducted to verify the accuracy of the sTIF model. Meanwhile, the difference between sTIF(d) and sTIF(c) is studied. It turns out that the removal depths of sTIF(d) and sTIF(c) are almost the same, and the continuous precession polishing can be replaced by discrete precession polishing to ease control in practical polishing process especially for the aspheric surfaces polishing.