Effects of Pt and Ta addition on compositional microstructure of CoCr-alloy thin film media
Effects of Pt and Ta addition on compositional microstructure of CoCr-alloy thin film media
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Pt和Ta的添加对CoCr合金薄膜介质成分微观结构的影响
DOI：
10.1063/1.372867
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发表时间：
2000
影响因子：
3.2
通讯作者：
M. Futamoto
中科院分区：
文献类型：
--
作者：
N. Inaba;M. Futamoto
用分析电子显微镜研究了铬含量约为15 at. %的Co-Cr-Ta、Co-Cr-Pt和Co-Cr-Pt-Ta薄膜介质的成分偏析结构。CoCrTa样品中的铬原子高度集中在晶界附近，最大浓度约为23at. %，宽度为1 nm，而晶内的铬原子浓度约为平均成分的一半。Co-铬-铂合金中的铬在晶界出现偏聚，最大浓度比平均成分高出4at. %。晶内的铬浓度与平均浓度基本一致。Co-Cr-Pt-Ta样品表现出一定程度的铬在Co-Cr-Ta和Co-Cr-PT系统之间的偏析。与正常晶界相比，双晶晶界的富铬范围更广，富铬更弱。
Compositional segregation structures of Co–Cr–Ta, Co–Cr–Pt, and Co–Cr–Pt–Ta thin film media with Cr concentrations of about 15 at. % were studied using an analytical transmission electron microscope. Cr atoms in the CoCrTa specimen are extremely localized around the grain boundaries with a maximum concentration of about 23 at. % with a width of 1 nm, while that inside the grain is about a half of the average composition. The Co–Cr–Pt specimen shows Cr segregation at grain boundaries with a maximum concentration by 4 at. % greater than the average composition. The Cr concentration inside the grain is kept nearly same with the average concentration. The Co–Cr–Pt–Ta specimen shows a degree of Cr segregation between the Co–Cr–Ta and the Co–Cr–Pt systems. The Cr enrichment at bicrystal grain boundaries is broader and weaker than those at the normal grain boundaries.