Structural and electrical properties of SrZr0.95Y0.05O3/SrTiO3 superlattices
Structural and electrical properties of SrZr0.95Y0.05O3/SrTiO3 superlattices
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DOI：
10.1016/j.ssi.2006.05.043
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发表时间：
2006-10-31
影响因子：
3.2
通讯作者：
Yugami, Hiroo
中科院分区：
文献类型：
--
作者：
Kuwata, Naoaki;Sata, Noriko;Yugami, Hiroo
制备了钙钛矿型氧化物质子导体SrZ（r0.95）Y（0.05）O（3）/SrTiO 3超晶格薄膜，并对其结构和电学性能进行了研究。X射线衍射和电子衍射分析表明，薄膜是在MgO（001）衬底上外延生长的。高分辨透射电子显微镜观察表明，多层结构是均匀的，不同层之间的界面是低粗糙度。在界面处发现失配位错，其Burgers矢量在方向a[100]上。从局部元素分析，没有观察到Zr和Ti在层间的相互扩散，而观察到Mg杂质从衬底扩散。通过阻抗谱测量薄膜的面内电导率。超晶格的电导率显示出比单个SrZr 0.95Y 0.05O3膜更高的值。外延层的激活能比相应的单晶体的激活能高。(c)2006 Elsevier B. V.保留所有权利。
Superlattice thin films of a perovskite-type oxide proton conductor SrZ(r0.95)Y(0.05)O(3)/SrTiO3 were fabricated and their structural and electrical properties were investigated. X-ray and electron diffraction analysis reveals that the thin films were epitaxially gown on MgO (001) substrate. High-resolution transmission electron microscopy observation shows that the multilayered structure is uniform and that the interfaces between the different layers are of low roughness. Misfit dislocations are found at the interface, having Burgers vectors in direction a[100]. From the local elemental analysis, the interdiffusion of Zr and Ti between layers was not observed, while Mg impurities diffused from the substrate are observed. The in-plane electrical conductivity of the thin films was measured by impedance spectroscopy. The conductivity of the superlattices shows a higher value than a single SrZr0.95Y0.05O3 film. The activation energies of the epitaxial layers show relatively higher value than the corresponding single crystal. (c) 2006 Elsevier B.V. All rights reserved.