A study of adventitious contamination layers on technically important substrates by photoemission and NEXAFS spectroscopies
A study of adventitious contamination layers on technically important substrates by photoemission and NEXAFS spectroscopies
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DOI：
10.1016/j.vacuum.2017.10.038
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发表时间：
2018-02
期刊：
影响因子：
4
通讯作者：
Sumona Sinha;M. Mukherjee
中科院分区：
文献类型：
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作者：
Sumona Sinha;M. Mukherjee
