Scanning Hall-probe microscopy for site-specific observation of microstructure in superconducting wires and tapes for the clarification of their performance bottlenecks
Scanning Hall-probe microscopy for site-specific observation of microstructure in superconducting wires and tapes for the clarification of their performance bottlenecks
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DOI：
10.1088/1361-6668/ab89ef
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发表时间：
2020-06-01
影响因子：
3.6
通讯作者：
Kiss, Takanobu
中科院分区：
文献类型：
--
作者：
Higashikawa, Kohei;Inoue, Masayoshi;Kiss, Takanobu
本文报告了一种诊断方法，用于澄清超导线材和带材的性能瓶颈，以便进一步提高其性能。特别介绍了我们在扫描霍尔探针显微镜(SHPM)上所取得的成果，它很好地用于选择扫描电子显微镜、透射电子显微镜和X射线CT观察微观结构的位置。这种混合显微镜提供了实际规模的超导导线或带的性能与其微米或纳米结构来源之间的直接关系的信息。作为这样的例子，本文通过回顾我们过去的研究，报道了对多芯镁线、商用长RE-123涂层导体和条纹状多芯涂层导体的表征结果。
This paper reports a diagnostic method for clarifying performance bottlenecks in superconducting wires and tapes for their further performance enhancements. In particular, our achievements by scanning Hall-probe microscopy (SHPM), which worked well for selecting positions for microstructure observation by SEM, TEM, and x-ray CT, are introduced. This hybrid microscopy offers the information of the direct relationship between the performance of a practical-scale superconducting wire or tape and its origin in micro-scale or nano-scale structure. As such examples, characterization results for an MgB2 multi-filamentary wire, a commercially available long RE-123 coated conductor, and a striated multi-filamentary coated conductor are reported in this paper through reviewing our past studies.