Band positions used for on-line crystallographic orientation determination from electron back scattering patterns. Discussion
Band positions used for on-line crystallographic orientation determination from electron back scattering patterns. Discussion
复制标题
用于根据电子背散射图案在线确定晶体取向的能带位置。
DOI：
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发表时间：
1991
期刊：
影响因子：
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通讯作者：
D. Newbury
中科院分区：
文献类型：
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作者：
N. Schmidt;J. Bilde;D. Jensen;D. Joy;J. Hjelen;D. Newbury
用于在线分析电子背散射图案（EBSP）的计算机程序已经开发出来。实验性 EBSP 是由计算机记录并显示在计算机显示器上的。用户用光标识别 EBSP 中至少两个带的位置。根据该输入，计算机计算可能的晶体取向。模拟相应的 EBSP 并将其叠加在实验 EBSP 上。正确的晶体取向是通过实验和模拟 EBSP 之间的比较来确定的。通常，每个模式的分析需要 10-30 秒。本程序的优点是它可以应用于任何晶体对称性，它不需要关于电子衍射图的知识，它可以用于具有相对低对比度的EBSP，并且索引非常精确。对于相对取向测量，精度被发现在 0.05° -0.20° 范围内，而对于样品和 EBSP 设备完全重新安装后给定晶粒的重复测量，精度被确定为 0.5°。此外，该过程有利于全自动模式识别。
A computer procedure for on-line analysis of electron back scattering patterns (EBSP) has been developed. An experimental EBSP is computer recorded and displayed on a computer monitor. The user identifies the positions of at least two bands in the EBSP with a cursor. Based on this input the computer calculates possible crystallographic orientations. The corresponding EBSPs are simulated and superimposed on the experimental EBSP. The correct crystallographic orientation is determined from a comparison between the experimental and simulated EBSPs. Typically, the analysis takes a 10-30 seconds per pattern. Advantages with the present procedure are that it can be applied for any crystal symmetry, that it requires no knowledge about electron diffraction maps, that it can be used for EBSPs with relatively low contrast , and that the indexing is very precise . For relative orientation measurements the accuracy is found to be within range 0.05° -0.20°, whereas, for repeated measurements of a given grain after complete remounting of sample and EBSP equipment, it was determined to be 0.5°. Furthermore, the procedure facilitates fully automatic pattern recognition.