Stress Distributions in Thin Bilayer Discs Subjected to Ball-On-Ring Tests
Stress Distributions in Thin Bilayer Discs Subjected to Ball-On-Ring Tests
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经受球环测试的薄双层圆盘中的应力分布
DOI：
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发表时间：
2005
期刊：
影响因子：
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通讯作者：
M. Ferber
中科院分区：
文献类型：
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作者：
Chun;M. Lance;M. Ferber
球-环试验已广泛用于脆性材料双轴强度的测量。然而，测试和分析仅限于性能均匀的材料。在本研究中开发的分析模型来分析薄双层光盘进行球环试验。结果发现，双层光盘的封闭形式的解决方案，可以从现有的解决方案单层光盘取代的中性表面的位置和单层的弯曲刚度与双层。为了验证双层膜的解析解，球环试验上生长的氧化物弥散强化FeCrAl合金盘上的薄Al 2 O3规模进行和光激励发光光谱用于测量在Al 2 O3层的应力分布。在这种情况下，由Al 2 O3氧化皮发射的R线的应力引起的峰位移用于确定通过氧化皮厚度的平均应力。预测和测量之间的良好协议。
Ball-on-ring tests have been used extensively to measure the biaxial strength of brittle materials. However, the tests and analyses are limited to materials of uniform properties. An analytical model is developed in the present study to analyze thin bilayer discs subjected to ball-on-ring tests. It is found that closed-form solutions for bilayer discs can be obtained from existing solutions for monolayer discs by replacing the position of the neutral surface and the flexural rigidity of monolayers with those of bilayers. To validate the analytical solutions for bilayers, ball-on-ring tests are performed on a thin Al2O3 scale grown on an oxide dispersion-strengthened FeCrAl alloy disc and photo-stimulated luminescence spectroscopy is used to measure the stress distributions in the Al2O3 layer. In this case, the stress-induced peak shift of the R lines emitted by the Al2O3 scale is used to determine the average stress through the scale thickness. Good agreement between predictions and measurements is obtained.