Influence of reactive SFx gases on electrode surfaces after electrical discharges under SF6 atmosphere
Influence of reactive SFx gases on electrode surfaces after electrical discharges under SF6 atmosphere
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DOI：
10.1109/94.841815
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发表时间：
2000-04-01
影响因子：
3.1
通讯作者：
Klockow, D
中科院分区：
文献类型：
--
作者：
Beyer, C;Jenett, H;Klockow, D
通过模拟SF6气氛下的不同放电，结合表面和深度分布分析，研究了腐蚀副产物对气体绝缘系统(GIS)电极的影响。在多特蒙德FUR SPEKTROSKOPIE(ISA)研究所的SF6放电室中，在不同条件下用火花(0.15J/火花)处理了铜、铝和银电极。同样的材料暴露在发生局部放电(PD)的地理信息系统测试室中的SF6中(巴西伊泰普)。用扫描电子显微镜的能量色散X射线(EDX)、X射线光电子能谱和高频等离子体二次中性质谱仪(SNMS)对处理后的材料进行了分析。对SNMS深度分布进行了校准，以便对与固体材料反应的部分腐蚀性气体产物进行定量。对暴露在压力SF6气氛中的电极的分析表明，表面反应仅在最上面的nm处发生，而在火花中，硫(S)，特别是氟(F)化合物被检测到接近40微米深。表面分析与反应气体产物的傅里叶变换红外(FTIR)测量首次比较表明，SF6的分解与电极退化的程度有关。
A simulation of different electrical discharges under SF6 atmosphere with subsequent surface and depth profile analysis is employed to investigate the effects that the formed corrosive byproducts have on gas-insulated system (GIS) electrodes. Cu, Al and Ag electrodes were treated with sparks (in the range of 0.15 J/spark) in an SF6 discharge cell under various conditions at the Institut fur Spektrochemie und Angewandte Spektroskopie (ISAS) in Dortmund. The same materials were exposed to SF6 in a GIS test compartment in which partial discharge (PD) occurred (Itaipu, Brazil). The treated materials were analyzed with energy dispersive X-ray (EDX) in a scanning electron microscope, X-ray photoelectron spectroscopy and high frequency (HF) plasma secondary neutral mass spectrometry (SNMS). The SNMS depth profiles were calibrated in order to quantify that part of the corrosive gaseous products having reacted with the solid material. The analysis of the electrodes exposed to the stressed SF6 atmosphere show surface reaction only in the topmost nm,whereas with sparks, sulfur (S) and especially fluorine (F) compounds are detected to similar to 40 mu m depths, A first comparison between surface analysis and Fourier transform infrared (FTIR) measurements of the reactive gaseous products indicates a correlation of SF6 decomposition and the extent of electrode degradation.