Fading Characteristic of Imaging Plate for a Transmission Electron Microscope

Fading Characteristic of Imaging Plate for a Transmission Electron Microscope
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DOI:
10.1093/oxfordjournals.jmicro.a051132
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发表时间:
1994-12
期刊:
Journal of Electron Microscopy
影响因子:
--
通讯作者:
T. Oikawa;D. Shindo;K. Hiraga
T. Oikawa;D. Shindo;K. Hiraga
中科院分区:
其他
文献类型:
--
作者:
T. Oikawa;D. Shindo;K. Hiraga

文献摘要

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成像板(IP)的图像记录原理是基于其上的荧光粉的光激励发光。在电子曝光和EP读数之间存在记录信号强度衰减的现象。在本研究中,为了在使用IP的定量分析中校准读出强度,测量了衰落特性。结果表明,衰减特性与电子曝光水平无关,因此,IP上记录的图像具有相对的量化能力。此外,通过使用衰落校正,可以测量绝对强度。
The image recording principle of the Imaging Plate (IP) is based on photo stimulable luminescence of the phosphor on it. There is a phenomenon of the recorded signal intensity fading between electron exposure and EP reading. In the present study, the fading characteristic was measured for a calibration of the read-out intensity in a quantitative analysis using the IP. According to the results, the fading characteristic is independent of the electron exposure level; therefore, a recorded image on the IP has a relative quantification capability. Also, by using the fading correction, it is possible to measure the absolute intensity.