SIMPLE: Structured illumination based point localization estimator with enhanced precision
SIMPLE: Structured illumination based point localization estimator with enhanced precision
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DOI：
10.1364/oe.27.024578
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发表时间：
2019-08-19
期刊：
影响因子：
3.8
通讯作者：
Wieser, Stefan
中科院分区：
文献类型：
--
作者：
Reymond, Loic;Ziegler, Johannes;Wieser, Stefan
We present a structured illumination microscopy based point localization estimator (SIMPLE) that achieves a 2-fold increase in single molecule localization precision compared to conventional centroid estimation methods. SIMPLE advances the recently introduced MINFLUX concept by using precisely phase-shifted sinusoidal wave patterns as nanometric rulers for simultaneous particle localization based on photon count variation over a 20 mu m field of view. We validate SIMPLE in silico and experimentally on a TIRF-SIM setup using a digital micro-mirror device (DMD) as a spatial light modulator. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
