Characterization of superconducting thin films by scanningSQUID microscopy and their device applications
Characterization of superconducting thin films by scanningSQUID microscopy and their device applications
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扫描SQUID显微镜表征超导薄膜及其装置应用
DOI：
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发表时间：
2015
期刊：
影响因子：
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通讯作者：
Shunichi ARISAWA
中科院分区：
文献类型：
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作者：
K. Endo;S. Arisawa;T. Tsuchiya;Y. Tateno;P. Badica;S. Kawai;M. Wada;I. Tsuyumoto,T. Kaneko;H. Kezuka;T. Endo;Shunichi ARISAWA
