High-quality LiNbO3 microdisk resonators by undercut etching and surface tension reshaping
High-quality LiNbO3 microdisk resonators by undercut etching and surface tension reshaping
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DOI:
10.1364/oe.20.028119
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发表时间:
2012-12-17
期刊:
影响因子:
3.8
通讯作者:
Niu, Huan
中科院分区:
文献类型:
--
作者:
Wang, Tzyy-Jiann;He, Jheng-Yu;Niu, Huan
We report ultra-smooth LiNbO3 microdisk resonators fabricated by selective ion implantation, chemical etching, and thermal treatment. The undercut microdisk structure is produced by chemically etching the buried lattice damage layer formed by selective ion implantation. By thermal treatment, surface tension smoothes and reshapes microdisk surface topography. The resonant characteristics of microdisk resonators are simulated by finite element method and are well consistent with the experimental results. The 20 mu m-diameter microdisk resonator has the FSR of 16.43nm and the Q factor of 2.60 x 10(4). The produced LiNbO3 microdisk resonators can be utilized in new microdisk applications with electro-optic and nonlinear-optic effects. (C)2012 Optical Society of America