Molecular secondary ion mass spectrometry with a liquid metal ion primary source
Molecular secondary ion mass spectrometry with a liquid metal ion primary source
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使用液态金属离子主源进行分子二次离子质谱分析
DOI：
10.1021/ac00259a031
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发表时间：
1983
影响因子：
7.4
通讯作者：
L. Swanson
中科院分区：
文献类型：
--
作者：
D. Barofsky;U. Giessmann;A. Bell;L. Swanson
研究了Ga、In、SiAu和Bi液态金属离子（LMI）发射体作为基体辅助分子二次离子质谱（西姆斯）的一次源。prin-unr观察结果是来自每种测试化合物的甘油溶液的非常高的分子离子丰度（10-50倍于Ar快原子轰击），分子离子信号对初级束电流密度的强烈增加的依赖性，直到~ 10~® A cm-2的饱和水平，分子离子丰度对轰击元素的原子序数的强烈增加的依赖性，二次离子能量扩展约为3 eV，二次离子信号的统计波动约为3-10%。LMI/SI MS质谱和其他软电离技术之间没有观察到本质上的定性差异。应用在西姆斯分析中，二次离子过程的基本研究，以及可能的生物组织的局部分子分析与离子显微镜相结合。从1969年引入场解吸质谱（1）开始，在热不稳定的高分子量有机化合物的质谱分析中发生了革命性的进展。最近，采用原子离子（2-4）或中性原子（5，6）原束的二次离子质谱（西姆斯）对这一进展做出了重大贡献。分子西姆斯的一些主要发展是通过使用初级束来实现的，
The use of Ga, In, SiAu, and Bi liquid metal Ion (LMI) emitters as primary sources In matrix assisted molecular secondary ion mass spectrometry (SIMS) was investigated. The prin-cipal observations were a very high molecular Ion abundance from the glycerol solution of every test compound (10-50 times that attainable with Ar fast atom bombardment), a strong increasing dependence of molecular Ion signal on primary beam current density up to a saturation level at~ 10~® A cm-2, a strong Increasing dependence of molecular Ion abundance on atomic number of the bombarding element, a secondary Ion energy spread of~ 3 eV, and a statistical fluctuation of~ 3-10% In the secondary Ion signals. No essential, qualitative differences were observed between LMI/SI MS mass spectra and those of other soft Ionization techniques. Applications In SIMS analyses, fundamental in-vestigations of secondary ion processes, and, possibly, localized molecular analysis of biological tissue coupled with Ion microscopy are Indicated.Beginning with the introduction of field desorption mass spectrometry in 1969 (1), revolutionary advances have taken place in the mass spectrometric analysis of thermally labile, high molecular weight organic compounds. Relatively recently, secondary ion mass spectrometry (SIMS) employing either atomic ion (2-4) or neutral atom (5, 6) primary beams has contributed significantly to this progress. Some of the major developments in molecular SIMS have been brought about through the use of primary beams with