RECONSTRUCTION OF 3 DIMENSIONAL STRUCTURE FROM PROJECTIONS AND ITS APPLICATION TO ELECTRON MICROSCOPY
RECONSTRUCTION OF 3 DIMENSIONAL STRUCTURE FROM PROJECTIONS AND ITS APPLICATION TO ELECTRON MICROSCOPY
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根据投影重建三维结构及其在电子显微镜中的应用
DOI：
10.1098/rspa.1970.0119
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发表时间：
1970-01-01
影响因子：
--
通讯作者：
KLUG, A
中科院分区：
文献类型：
--
作者：
CROWTHER, RA;DEROSIER, DJ;KLUG, A
透射电子显微照片实质上是样品在观察方向上的投影。为了重建样本的三维图像，有必要能够联合收割机组合来自多个不同视图的数据。这个问题的一个正式的解决方案中给出的傅立叶变换。它的实现需要数据简化和插值。最终的解决方案是由最小二乘法，这也表明了多少视图必须包括一个给定的粒子，以给定的分辨率程度的有效重建。不同的权力的插值程序给出，根据经济与可用的数据必须使用。另一种方法是直接重建，而不使用傅立叶变换，但它被证明是在一般不太实际的傅立叶方法。
A transmission electron micrograph is essentially a projection of the specimen in the direction of view. In order to reconstruct a three-dimensional image of the specimen, it is necessary to be able to combine data from a number of different views. A formal solution of this problem is given in terms of Fourier transforms. Its realization requires data reduction and interpolation. The final solution is given by a least squares approach, which also indicates how many views must be included to give a valid reconstruction of a given particle to a given degree of resolution. Interpolation procedures of varying power are given, to be employed according to the economy with which the available data must be used. An alternative procedure is described for direct reconstruction without the use of Fourier transforms, but it is shown to be in general less practicable than the Fourier approach.