Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS.
Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS.
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使用 SRS 16.3 站的能量色散同步加速器 X 射线衍射进行快速残余应力测绘。
DOI：
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发表时间：
2002
影响因子：
2.5
通讯作者：
K. E. James
中科院分区：
文献类型：
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作者：
A. Korsunsky;S. Collins;R. A. Owen;M. Daymond;Saïda Achtioui;K. E. James
报道了SRS 16.3站同步加速器能量色散x射线衍射残余应变成像实验。带有能量鉴别检测器的白光光束可以通过3毫米的Al， Ti， Fe和Cu合金进行测量，每0.3毫米(3)取样体积的采集时间约为30秒。通过单峰拟合和全图Pawley精化分析，得到应变精度优于10（-4）。因此，这种配置对于使用第二代同步加速器源的薄组件的快速应变映射非常有效。
Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of approximately 30 s per 0.3 mm(3) sampling volume. The collected profiles were analysed using single-peak fitting and whole-pattern Pawley refinement, and produced strain accuracy better than 10(-4). This configuration is therefore highly efficient for fast strain mapping in thin components using a second-generation synchrotron source.