A high-resolution X-ray microscope system for performance evaluation of scintillator plates
A high-resolution X-ray microscope system for performance evaluation of scintillator plates
复制标题
DOI：
10.1088/1748-0221/17/09/t09012
复制
发表时间：
2022-09-01
影响因子：
1.3
通讯作者：
Kataoka, Jun
中科院分区：
文献类型：
--
作者：
Yamamoto, Seiichi;Yoshino, Masao;Kataoka, Jun
在开发用于X射线成像的新型闪烁体时，需要一个高分辨率和高效率的系统来评价闪烁体的性能。为此，我们研制了一套高分辨率X射线显微镜系统。开发的紧凑型X射线显微镜系统基于放大单元和冷却电荷耦合器件(CCD)相机，并结合小型工业X射线照射系统。利用该系统对三块闪烁板进行了成像，并对其空间分辨率进行了评价。将每个闪烁板放置在物镜前，对闪烁板进行X射线照射，得到面具的透射图。闪烁板的测量空间分辨率从16微米到30微米不等，这取决于闪烁板的类型。X射线管的焦点尺寸对所评估的闪烁板的图像的空间分辨率的影响几乎可以忽略不计。
In the development of new scintillators for X-ray imaging, a high-resolution and highly efficient system is required to evaluate the performance of the scintillator plates. For this purpose, we developed a high-resolution X-ray microscope system. The developed compact X-ray microscope system is based on a magnifying unit and a cooled charge-coupled device (CCD) camera, combined with a small industrial X-ray irradiation system. Using this system, we carried out imaging of three scintillator plates and evaluated their spatial resolution. Each scintillator plates was set in front of the lens of the objective, X-rays were irradiated to the scintillator plates, and transmission images of masks were acquired. The measured spatial resolution of the scintillator plates varied from 16 mu m to 30 mu m, depending on the type of scintillator plate. The focus size of the X-ray tube had an almost negligible effect on the spatial resolution of the images for the evaluated scintillator plates.