Synthesis and electrical characterization of silver nanobeams.
Synthesis and electrical characterization of silver nanobeams.
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DOI：
10.1021/nl061705n
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发表时间：
2006-09
期刊：
影响因子：
10.8
通讯作者：
B. Wiley;Zenghui Wang;Jiang Wei;Yadong Yin;D. Cobden;Younan Xia
中科院分区：
文献类型：
--
作者：
B. Wiley;Zenghui Wang;Jiang Wei;Yadong Yin;D. Cobden;Younan Xia
通过减慢原子添加到单孪晶种子的速率，我们已经生长出长度为3-30 μ m，宽度为17 - 70 nm，宽度与厚度之比为1.4的银纳米梁。纳米梁的良好定义的尺寸，光滑的表面和结晶度使它们成为研究尺寸对电子输运影响的有希望的候选者。用一个简单的方法，允许快速表征单纳米梁，我们发现，即使是最薄的纳米梁在很大程度上保留了低电阻率的散装银。纳米束可以支持高达2.6 × 10（8）A cm（-2）的非常高的电流密度，然后导电路径被纳米间隙的形成所破坏。
By slowing the rate of atomic addition to singly twinned seeds, we have grown silver nanobeams with lengths of 3-30 mum, widths ranging from 17 to 70 nm, and a width to thickness ratio of 1.4. The well-defined dimensions, smooth surface, and crystallinity of nanobeams make them promising candidates for studying the effects of size on electron transport. With a simple method that allows rapid characterization of single nanobeams, we find that even the thinnest nanobeams largely retain the low resistivity of bulk silver. Nanobeams can support remarkably high current densities of up to 2.6 x 10(8) A cm(-2) before the conduction path is broken by the formation of a nanogap.