Measurement of Polarization-Inverted Structure in Layered Piezoelectric Material Using Scanning Nonlinear Dielectric Microscopy
Measurement of Polarization-Inverted Structure in Layered Piezoelectric Material Using Scanning Nonlinear Dielectric Microscopy
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使用扫描非线性介电显微镜测量层状压电材料中的极化反转结构
DOI:
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发表时间:
2018
期刊:
影响因子:
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通讯作者:
Yohei Tanaka and Yasuo Cho
中科院分区:
文献类型:
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作者:
Hiroyuki Odagawa;Yohei Tanaka and Yasuo Cho