Fast full-field out-of-plane deformation measurement using fringe reflectometry
Fast full-field out-of-plane deformation measurement using fringe reflectometry
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DOI：
10.1016/j.optlaseng.2011.05.006
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发表时间：
2012-04
影响因子：
4.6
通讯作者：
Lei Huang;C. Ng;A. Asundi
中科院分区：
文献类型：
--
作者：
Lei Huang;C. Ng;A. Asundi
利用条纹反射法可以快速方便地实现镜面离面变形的全场测量。系统配置简单，处理速度快。借助于一种先进的条纹图处理技术--窗口傅立叶脊法，只需一幅双向条纹图就可以确定变形表面的轮廓。因此，整个测量仅需要具有高速或甚至真实的时间测量潜力的单个图像。
Full-field out-of-plane deformation measurement of specular surfaces can be implemented quickly and conveniently using fringe reflectometry. The system configuration is simple and processing is fast. With the assistance of an advanced fringe pattern processing technique, the windowed Fourier ridges method, only a single two-directional fringe pattern is necessary for determination of the deformed surface profile. Thus, the whole measurement only requires a single image with the potential for high speed or even real time measurement.