Ultrahigh-sensitivity single-photon detection with linear-mode silicon avalanche photodiode.
Ultrahigh-sensitivity single-photon detection with linear-mode silicon avalanche photodiode.
复制标题
使用线性模式硅雪崩光电二极管进行超高灵敏度单光子检测。
DOI：
10.1364/ol.35.002621
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发表时间：
2010
期刊：
影响因子：
3.6
通讯作者：
M. Sasaki
中科院分区：
文献类型：
--
作者：
M. Akiba;K. Tsujino;M. Sasaki
我们利用具有低温低噪声读出电路的线性模式雪崩光电二极管（APD）开发了一种超高灵敏度单光子探测器；APD运行在78K。在450nm波长下，探测器的噪声等效功率低至2.2x10(-20)W/Hz（1/2）。光子探测效率和暗计数率（DCR）分别为0.72和0.0008计数/秒。当热处理温度在100K以上时，通过热处理减少了被困载流子，实现了较低的DCR。
We developed an ultrahigh-sensitivity single-photon detector using a linear-mode avalanche photodiode (APD) with a cryogenic low-noise readout circuit; the APD is operated at 78K. The noise-equivalent power of the detector is as low as 2.2x10(-20)W/Hz(1/2) at a wavelength of 450nm. The photon-detection efficiency and dark-count rate (DCR) are 0.72 and 0.0008counts/s, respectively. A low DCR is achieved by thermal treatment for reducing the trapped carriers when the thermal treatment temperature is above 100K.