Noise-induced threshold shift and pattern formation in electroconvection by controlling characteristic time scales
Noise-induced threshold shift and pattern formation in electroconvection by controlling characteristic time scales
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DOI:
10.1103/physreve.84.025302
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发表时间:
2011-08-26
影响因子:
2.4
通讯作者:
Huh, Jong-Hoon
中科院分区:
文献类型:
--
作者:
Huh, Jong-Hoon
We report external noise-induced threshold shift and pattern formation in ac-driven electroconvection (EC) in nematic liquid crystals. We investigate the noise intensity dependence of the threshold and determine the relationship f*(c) = hf(cd)(a) (alpha similar to 1.4, h similar to 0.1) between the characteristic cutoff frequency (f*(c)) of the noise and the characteristic ac frequency (f(cd)) of EC. For f(c) > f*(c), the noise contributes to stabilizing EC (i.e., upward threshold shift), whereas for f(c) < f*(c), it contributes to destabilizing EC (i.e., downward threshold shift). For f(c) = f*(c), the noise makes no contribution to the threshold shift. However, the characteristic wavelength of EC strongly depends on the noise intensity but not on f(c).