Beam test of a full-length prototype of the BESIII drift chamber with the readout electronics
Beam test of a full-length prototype of the BESIII drift chamber with the readout electronics
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DOI:
10.1016/j.nima.2006.11.032
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发表时间:
2007-02
影响因子:
1.4
通讯作者:
Z. Qin;Y. Chen;H. Sheng;L. Wu;J. Liu;B. Zhuang;X. Jiang;Y. Zhao;K. Zhu;Z. Yan;Chen Chen-Chen;Miaofu Xu;L. Wang;X. Ma;Xiao Tang;R. Liu;Yi Jin;Q. Zhu;Z. Ge;Zhongdao Wu;R. Li;P. Zhao;H. Dai;X. Li;Jing Li
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文献类型:
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作者:
Z. Qin;Y. Chen;H. Sheng;L. Wu;J. Liu;B. Zhuang;X. Jiang;Y. Zhao;K. Zhu;Z. Yan;Chen Chen-Chen;Miaofu Xu;L. Wang;X. Ma;Xiao Tang;R. Liu;Yi Jin;Q. Zhu;Z. Ge;Zhongdao Wu;R. Li;P. Zhao;H. Dai;X. Li;Jing Li
A full-length prototype of the BESIII drift chamber together with its readout electronics was built and a beam test was performed. Two different methods, namely “single-threshold method” and “double-threshold method” for timing measurement, were studied. Test results show that the BESIII drift chamber and its readout electronics can reach their design specifications. The “double-threshold method” results in a better timing accuracy and noise suppression capabilities as compared with the “single-threshold method”.