Stress singularity near the crack-tip in silicon carbide : Investigation by atomic force microscopy
Stress singularity near the crack-tip in silicon carbide : Investigation by atomic force microscopy
复制标题
碳化硅裂纹尖端附近的应力奇点：原子力显微镜研究
DOI：
10.1016/s1359-6454(98)00076-7
复制
发表时间：
1998
期刊：
影响因子：
9.4
通讯作者：
T. Kinoshita
中科院分区：
文献类型：
--
作者：
T. Kinoshita
利用原子力显微镜（AFM）的高空间分辨率，发展了一种新的尖端应力场测量技术。为了评估所提出的技术的灵敏度，近尖端应力奇异性在98 N努氏裂纹热压碳化硅进行了研究，在弯曲过程中的应力为110 MPa的原位AFM观察。AFM观察得到的形貌表明，近端应力奇异性产生了长轴为1.20 μm的椭圆形中空区域。垂直位移在裂纹尖端附近最大，最大值为2.5nm。进行了三维有限元（FEM）分析，得到的位移与原子力显微镜测量的位移一致。通过对AFM形貌的分析，验证了裂纹尖端的应力场可以被评估，并且AFM测量的凹陷源于应力奇异性。
A new technique using the high spatial resolution of atomic force microscopy (AFM) was developed to measure the near-tip stress field. In order to assess the sensitivity of the proposed technique, the near-tip stress singularity at a 98 N Knoop crack in hot-pressed silicon carbide was investigated by in situ AFM observations during bending with a stress of 110 MPa. The topographies obtained in the AFM observations indicated that the near-tip stress singularity produced an elliptical hollow area with a long axis of ∼20μm. The vertical displacement was highest near the crack-tip with a maximum of 2.5nm. Three-dimensional finite-element (FEM) analyses were performed and the displacements obtained were consistent with those measured by AFM. It was verified that the crack-tip stress field can be evaluated by analyzing the AFM topographies and that the depression measured by AFM originates in the stress singularity.
影响因子：
5.4
作者：
NEWMAN, JC;RAJU, IS
通讯作者：
RAJU, IS