Multilayer Graphene‐Coated Atomic Force Microscopy Tips for Molecular Junctions
Multilayer Graphene‐Coated Atomic Force Microscopy Tips for Molecular Junctions
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DOI：
10.1002/adma.201200579
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发表时间：
2012-07
影响因子：
29.4
通讯作者：
Yugeng Wen;Jianyi Chen;Yunlong Guo;Bin Wu;G. Yu;Yunqi Liu
中科院分区：
文献类型：
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作者：
Yugeng Wen;Jianyi Chen;Yunlong Guo;Bin Wu;G. Yu;Yunqi Liu
多层石墨烯尖端被开发用于进行探针原子力显微镜的分子结的形成。使用石墨烯尖端的分子结显示出非常小的尖端到尖端变化、优异的操作稳定性、良好的耐久性和长的保质期。这些特性，加上高产量和简单的加工，表明石墨烯尖端的商业化大规模生产对于分子电子应用是可行的。
Multilayer graphene tips are developed for conducting probe atomic force microscopy for the formation of molecular junctions. Molecular junctions using graphene tips show very small tip-to-tip variance, excellent operational stability, good endurance, and long shelf-life. These properties, together with high yield and the simple processing involved, suggest that commercial mass-production of graphene tips is viable for molecular electronic applications.