Coffee Cup Atomic Force Microscopy
Coffee Cup Atomic Force Microscopy
复制标题
咖啡杯原子力显微镜
DOI：
10.1021/ed800076t
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发表时间：
2010
影响因子：
3
通讯作者：
R. P. Duyne
中科院分区：
文献类型：
--
作者：
David E. Ashkenaz;W. P. Hall;C. Haynes;E. M. Hicks;A. Mcfarland;L. J. Sherry;D. A. Stuart;Korin E. Wheeler;C. R. Yonzon;J. Zhao;H. Godwin;R. P. Duyne
在这个活动中，学生使用一个从咖啡杯或卡纸剪切创建的模型来探索原子力显微镜（AFM）的工作原理。学生操作AFM模型，使用它来检查各种对象，以检索地形数据，然后绘制和解释结果。学生们观察到AFM悬臂的运动可以通过激光束的偏转来监测。学生的目标是检查宏观物体，并将其测量技术与实际AFM的原子和分子尺度测量相关联。
In this activity, students use a model created from a coffee cup or cardstock cutout to explore the working principle of an atomic force microscope (AFM). Students manipulate a model of an AFM, using it to examine various objects to retrieve topographic data and then graph and interpret results. The students observe that movement of the AFM cantilever can be monitored by the deflection of a laser beam. Goals for the students are to examine macroscopic objects and relate their measurement technique to the atomic- and molecular-scale measurements of an actual AFM.