A first investigation of accuracy, precision and sensitivity of phase-based x-ray dark-field imaging
A first investigation of accuracy, precision and sensitivity of phase-based x-ray dark-field imaging
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DOI：
10.1088/0022-3727/49/48/485501
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发表时间：
2016-11
期刊：
影响因子：
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通讯作者：
A. Astolfo;M. Endrizzi;G. Kallon;T. P. Millard;F. Vittoria;A. Olivo
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文献类型：
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作者：
A. Astolfo;M. Endrizzi;G. Kallon;T. P. Millard;F. Vittoria;A. Olivo
在过去的二十年中，X 射线相衬成像 (XPCI) 作为对广泛使用和成熟的 X 射线成像的潜在重大改进而引起了人们的关注。关键是它能够获取新的物理量（“相移”），这可以与 X 射线吸收相补充。 XPCI 的另一项优势是其通过折射诱导暗场 (DF) 对微观结构细节的敏感性。虽然 DF 被广泛提及并用于多种应用，但预测 XPCI 系统定量检索 DF 的能力并不简单。在本文中，我们评估了不同设计选项和算法对边缘照明 (EI) XPCI 技术的 DF 检索的影响。蒙特卡罗模拟在实验数据的支持下，用于测量基于传统 X 射线源的多个 EI 系统执行 DF 检索的准确度、精密度和灵敏度。引入的工具易于实现，并且足够通用，可以评估基于替代（即非 EI）XPCI 方法的系统的 DF 性能。
In the last two decades, x-ray phase contrast imaging (XPCI) has attracted attention as a potentially significant improvement over widespread and established x-ray imaging. The key is its capability to access a new physical quantity (the ‘phase shift’), which can be complementary to x-ray absorption. One additional advantage of XPCI is its sensitivity to micro structural details through the refraction induced dark-field (DF). While DF is extensively mentioned and used for several applications, predicting the capability of an XPCI system to retrieve DF quantitatively is not straightforward. In this article, we evaluate the impact of different design options and algorithms on DF retrieval for the edge-illumination (EI) XPCI technique. Monte Carlo simulations, supported by experimental data, are used to measure the accuracy, precision and sensitivity of DF retrieval performed with several EI systems based on conventional x-ray sources. The introduced tools are easy to implement, and general enough to assess the DF performance of systems based on alternative (i.e. non-EI) XPCI approaches.