The range of VCSEL wearout reliability acceleration behavior and its effects on applications
The range of VCSEL wearout reliability acceleration behavior and its effects on applications
复制标题
VCSEL 磨损可靠性加速行为的范围及其对应用的影响
DOI：
10.1117/12.2002840
复制
发表时间：
2013
期刊：
影响因子：
--
通讯作者：
J. Tatum
中科院分区：
文献类型：
--
作者：
J. Guenter;L. Graham;B. Hawkins;R. Hawthorne;Ralph H. Johnson;G. Landry;J. Tatum
近二十年来，大多数VCSEL磨损可靠性模型都在0.7 eV附近引入了Arrhenius激活能，通常还有一个适度的电流指数。随着VCSEL的生产扩展到更多的波长、功率和速度机制，新的有源区、反射镜设计和生长条件变得必要。即使在更传统的VCSEL 850 nm波长下，也出现了非常不同的可靠性加速系数的情况。在某些情况下，这些因素会对正常使用条件下的预期可靠性产生深远影响，从而导致磨损寿命变化超过一个数量级。这些差异使VCSEL在通信应用中能够扩展到更高的速度，其可靠性与以前的低速设备相同，甚至更高。本文讨论了一些新的应用，不同的磨损行为，以及它们在实际操作中的意义。并讨论了不同的加速行为对可靠性试验的影响。
For nearly twenty years most models of VCSEL wearout reliability have incorporated Arrhenius activation energy near 0.7 eV, usually with a modest current exponent in addition. As VCSEL production extends into more wavelength, power, and speed regimes new active regions, mirror designs, and growth conditions have become necessary. Even at more traditional VCSEL 850-nm wavelengths instances of very different reliability acceleration factors have arisen. In some cases these have profound effects on the expected reliability under normal use conditions, resulting in wearout lifetimes that can vary more than an order of magnitude. These differences enable the extension of VCSELs in communications applications to even greater speeds with reliability equal to or even greater than the previous lowerspeed devices. This paper discusses some of the new applications, different wearout behaviors, and their implications in real-life operation. The effect of different acceleration behaviors on reliability testing is also addressed.