Linear ion trap for second order Doppler shift reduction in frequency standard applications
Linear ion trap for second order Doppler shift reduction in frequency standard applications
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用于频率标准应用中二阶多普勒频移降低的线性离子阱
DOI：
10.1109/freq.1989.68848
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发表时间：
1990
期刊：
影响因子：
--
通讯作者：
L. Maleki
中科院分区：
文献类型：
--
作者：
J. Prestage;G. Janik;G. Dick;T. Tucker;L. Maleki
设计并测试了一种新型的线性离子陷阱，它允许存储大量的离子，同时降低了对射频限制场引起的二阶多普勒效应的敏感性。这种陷阱应该可以存储大约20倍于传统RF陷阱可存储的离子数量，而不会相应地增加来自禁闭电场的二阶多普勒频移。此外，这种漂移对陷阱参数(即射频电压、射频频率和陷阱大小)的敏感度大大降低。汞离子和氙离子在氦缓冲气体中被捕获。已经测量了长达2×10/sup 3/S的陷阱时间。
A novel linear ion trap is designed and being tested which permits storage of a large number of ions with reduced susceptibility to the second-order Doppler effect caused by the RF confining fields. This trap should store about 20 times the number of ions storable by a conventional RF trap, with no corresponding increase in second-order Doppler shift from the confining field. In addition the sensitivity of this shift to trapping parameters, i.e. RF voltage, RF frequency, and trap size, is greatly reduced. Mercury ions and xenon ions are trapped in the presence of helium buffer gas. Trap times as long as 2*10/sup 3/ s have been measured.<<ETX>>