X-ray diffraction at ultra-high pressures
X-ray diffraction at ultra-high pressures
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DOI:
10.1016/0022-3697(63)90092-1
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发表时间:
1963-12
影响因子:
4
通讯作者:
N. B. Owen;P. L. Smith;J. Martin;A. J. Wright
中科院分区:
文献类型:
--
作者:
N. B. Owen;P. L. Smith;J. Martin;A. J. Wright
Apparatus is described which was designed to obtain X-ray diffraction patterns from materials subjected to very high pressures. Miniature Bridgman anvils of diamond are used to squeeze the sample without the conventional form of annular gasket. Load is applied either directly by means of a helical compression spring or through a hydraulic intensifier with a load magnification of about 20. Models to fit two standard X-ray cameras of 5.73 and 11.46 cm diameter have been made and both can oscillate about the vertical axis in the usual manner. One model has been designed to oscillate through an included angle of 300° and has provision for heating the test sample to 250°C. X-ray diffraction patterns have been obtained at pressures exceeding a nominal 200 kb.The results of work on cadmium sulphide and cadmium telluride up to pressures of 200 kb obtained with this apparatus are given. Cadmium sulphide in the wurtzite form is found to transform to the rock salt structure under pressure while cadmium telluride transforms from the zincblende structure first to the rock salt structure and then to a diatomic analogue to the β-tin structure.