Measurement of x-ray pulse widths by intensity interferometry.
Measurement of x-ray pulse widths by intensity interferometry.
复制标题
通过强度干涉测量 X 射线脉冲宽度。
DOI：
10.1103/physrevlett.88.244801
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发表时间：
2002
影响因子：
8.6
通讯作者：
T. Ishikawa
中科院分区：
文献类型：
--
作者：
M. Yabashi;K. Tamasaku;T. Ishikawa
硬波荡器辐射的脉冲宽度（32 ps宽度，能量14 keV）由强度干涉测量法确定。该方法与各种X射线单色仪相结合，能够在从ns到fs的宽范围时间范围内进行测量。适用的目标包括测量第四代同步加速器光源的超快x射线脉冲宽度。
The pulse width of hard undulator radiation (32 ps width, energy 14 keV) was determined by intensity interferometry. The method, in combination with various x-ray monochromators, enables measurements to be taken over a wide range of time frames, from ns to fs. The applicable target includes measurements of ultrafast x-ray pulse widths from fourth generation synchrotron light sources.