Single-shot arrival timing diagnostics for a soft X-ray free-electron laser beamline at SACLA
Single-shot arrival timing diagnostics for a soft X-ray free-electron laser beamline at SACLA
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SACLA 软 X 射线自由电子激光束线的单次到达定时诊断
DOI：
10.1107/s1600577517015284
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发表时间：
2018
影响因子：
2.5
通讯作者：
Yabashi Makina
中科院分区：
文献类型：
--
作者：
Owada Shigeki;Nakajima Kyo;Togashi Tadashi;Kayatama Tetsuo;Yabashi Makina
本文介绍了在上海原子力实验室软X射线自由电子激光（FEL）光束线上进行的到达时间诊断。一维聚焦的强流软X射线自由电子激光脉冲有效地引起GaAs表面光反射率的瞬态变化。成功地测量了软X射线自由电子激光与激光脉冲之间的到达时间，作为反射率变化的空间位置。从成像系统的时间分辨率评价达到10fs。 这种方法只需要一小部分的入射脉冲能量，这使得同时操作的到达定时诊断和实验通过引入波前分裂方案。
Arrival timing diagnostics performed at a soft X-ray free-electron laser (FEL) beamline of SACLA are described. Intense soft X-ray FEL pulses with one-dimensional focusing efficiently induce transient changes of optical reflectivity on the surface of GaAs. The arrival timing between soft X-ray FEL and optical laser pulses was successfully measured as a spatial position of the reflectivity change. The temporal resolution evaluated from the imaging system reaches ∼10 fs. This method requires only a small portion of the incident pulse energy, which enables the simultaneous operation of the arrival timing diagnostics and experiments by introducing a wavefront-splitting scheme.