Effect of depth dependent spherical aberrations in 3D structured illumination microscopy
Effect of depth dependent spherical aberrations in 3D structured illumination microscopy
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DOI：
10.1364/oe.20.006527
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发表时间：
2012-03-12
期刊：
影响因子：
3.8
通讯作者：
Agard, David A.
中科院分区：
文献类型：
--
作者：
Arigovindan, Muthuvel;Sedat, John W.;Agard, David A.
我们建立了三维结构照明显微镜（SIM）中安装介质和浸没介质之间折射率失配引起的深度相关球差的模型。我们首先推导出一个前向模型，该模型考虑了深度变化像差对照明和检测过程的影响。从该模型中，我们表明，深度相关的球面像差导致的信号损失，仅由于其对系统的检测响应的影响，而其对照明的影响导致可以在重建过程中计算处理的订单之间的相移。此外，通过使用该模型，我们提供了具有不同复杂性的像差的光学校正的指导方针，并解释了所提出的校正如何简化前向模型。最后，我们表明，它是可能的，以纠正照明和检测像差使用变形镜只在显微镜的检测路径上。(C)2012美国光学学会
We model the effect of depth dependent spherical aberration caused by a refractive index mismatch between the mounting and immersion mediums in a 3D structured illumination microscope (SIM). We first derive a forward model that takes into account the effect of the depth varying aberrations on both the illumination and the detection processes. From the model, we demonstrate that depth dependent spherical aberration leads to loss of signal only due to its effect on the detection response of the system, while its effect on illumination leads to phase shifts between orders that can be handled computationally in the reconstruction process. Further, by using the model, we provide guidelines for optical corrections of aberrations with different complexities, and explain how the proposed corrections simplify the forward model. Finally, we show that it is possible to correct both illumination and detection aberrations using a deformable mirror only on the detection path of the microscope. (C) 2012 Optical Society of America