Role of covalent tip-surface interactions in noncontact atomic force microscopy on reactive surfaces
Role of covalent tip-surface interactions in noncontact atomic force microscopy on reactive surfaces
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DOI：
10.1103/physrevlett.78.678
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发表时间：
1997-01-27
影响因子：
8.6
通讯作者：
Terakura, K
中科院分区：
文献类型：
--
作者：
Perez, R;Payne, MC;Terakura, K
利用总能量赝势计算方法研究了非接触原子力显微镜在Si（ll）表面上的成像过程。在实验图像的某些部分中看到的原子分辨率归因于尖端顶端原子上的局部悬空键与表面上的附着原子上的悬空键之间的共价键的开始。这种相互作用主导了力梯度，它驱动用于创建实验图像的频率变化，并提供了在反应表面上进行原子分辨率成像的机制。
Total-energy pseudopotential calculations are used to study the imaging process in non-contact atomic force microscopy on Si(lll) surfaces. The atomic resolution seen in some parts of the experimental images is attributed to the onset of covalent bonding between a localized dangling bond on the atom at the apex of the tip and the dangling bonds on the adatoms in the surface. This interaction dominates the force gradients, which drive the frequency changes used to create the experimental images, and provides a mechanism for atomic resolution imaging on reactive surfaces.