Modelling bottom and topside electron density and TEC with profile data from topside ionograms
Modelling bottom and topside electron density and TEC with profile data from topside ionograms
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DOI:
10.1016/s0273-1177(00)00137-x
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发表时间:
2001-01-01
期刊:
影响因子:
--
通讯作者:
Depuev, V
中科院分区:
文献类型:
--
作者:
Nava, B;Radicella, SM;Depuev, V
The paper describes the technique that has been implemented to model the electron density distribution above and below the F2 peak making use of only the profiles obtained from the INTERCOSMOS-19 topside ionograms. Each single profile fr-om the satellite height to the ionosphere peak has been fitted by a semi-Epstein layer function of the type used in the DGR model with shape factor variable with altitude. The topside above the satellite height has been extrapolated to match given values of plasmaspheric electron densities to obtain the full topside profile. The bottomside electron density has been calculated by using the maximum electron density and its altitude estimated from the topside ionogram as input for a modified version of the DGR derived profiler that uses model values for the foF1 and foE layers of the ionosphere. Total electron content has also been calculated. Longitudinal cross sections of vertical profiles from latitudes 50 degreesN to 50 degreesS latitude are shown for low and high geomagnetic activity. These cross sections indicate the equatorial anomaly effect and the changes of the shape of low latitude topside ionosphere during geomagnetic active periods. These results and the potentiality of the technique are discussed. (C) 2001 COSPAR. Published by Elsevier Science Ltd. All rights reserved.