Waveguide two-point differential-excitation method for quantitative absorption measurements of nanostructures
Waveguide two-point differential-excitation method for quantitative absorption measurements of nanostructures
复制标题
用于纳米结构定量吸收测量的波导两点差分激发法
DOI:
10.1143/jjap.51.106601
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发表时间:
2012
期刊:
影响因子:
--
通讯作者:
Ken W. West
中科院分区:
文献类型:
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作者:
Toshimitsu Mochizuki;Masahiro Yoshita;Shun Maruyama;Changsu Kim;Keisuke Fukuda;Hidefumi Akiyama;Loren N. Pfeiffer;Ken W. West
To establish a new useful quantitative absorption measurement method for nanostructures, we investigated quantitative accuracy of a recently developed waveguide two-point differential-excitation method, which combines Fabry–Pérot fringe analysis and attenuated internal emission analysis for differential-path-length excitations. Quantitative absorption spectra of an 8-nm-thick GaAs quantum well at various temperatures consistent with theoretical predictions are demonstrated within 5% relative accuracy and a high dynamic range of 0–210 cm-1 in modal absorptions. The results were also compared with conventional photoluminescence excitation spectra of the same sample, which turned out to underestimate the absorption peak intensity of the lowest exciton at low temperatures.