Structural studies on TlInSe2 thermoelectric material by X-ray fluorescence holography, XAFS, and X-ray diffraction
Structural studies on TlInSe2 thermoelectric material by X-ray fluorescence holography, XAFS, and X-ray diffraction
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X射线荧光全息、XAFS和X射线衍射对TlInSe2热电材料的结构研究
DOI：
10.1002/pssb.201400247
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发表时间：
2015
期刊：
影响因子：
--
通讯作者：
and Nazim Mamedov
中科院分区：
文献类型：
--
作者：
Shinya Hosokawa;Kenji Kamimura;Hiroyuki Ikemoto;Naohisa Happo;Kojiro Mimura;Kouichi Hayashi;Kohki Takahashi;Kazuki Wakita;and Nazim Mamedov
利用X射线荧光全息（XFH）、XAFS和X射线衍射（XD）研究了TlInSe2热电材料中Tl原子周围的局域结构。随温度变化的XAFS和XD数据表明，没有发现明显的相变特征，Tl原子的位置在晶体的Tl链方向上随机波动，这与室温下的XFH结果一致。此外，所有这些实验都表明Tl和In原子的位置之间存在干涉。
The local structure around the Tl atoms in TlInSe2 thermoelectric material was investigated by X-ray fluorescence holography (XFH), XAFS, and X-ray diffraction (XD). The temperature dependent XAFS and XD data reveal that no distinct phase change features are found, and the position of the Tl atoms are fluctuated randomly in the Tl chain direction of the crystal, which is consistent with the XFH result at room temperature. Also, an interference between the positions of Tl and In atoms is suggested by all of these experiments.