A study of old information induced interpattern proximity shift (abstract)
A study of old information induced interpattern proximity shift (abstract)
复制标题
旧信息引起的模式间邻近偏移的研究（摘要）
DOI：
10.1063/1.353505
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发表时间：
1993
影响因子：
3.2
通讯作者：
C. Tsang
中科院分区：
文献类型：
--
作者：
Yaw;C. Tsang
本文介绍了由于背景中存在旧转变而导致的磁转变邻近位移的高精度测量。使用峰值检测电子器件，我们通过测量多位模式中的参考和测试转换之间的距离（在测试转换附近有或没有背景转换）来推断出这种模式间偏移。测量过程经过精心设计，以实现高精度。我们在背景和数据转换的简单和硬转换类型的情况下，测量了具有不同剩余厚度乘积的磁盘上 3380 型写入磁头的邻近偏移。结果显示出三种不同的转变行为，具体取决于背景到测试的转变间距离：远区逐渐衰减（≳2μm），中间区域快速上升，当两个转变几乎彼此重叠时，近区渐近饱和。渐近平移幅度一致...
This article presents a high precision measurement of the proximity shift on a magnetic transition due to the presence of an old transition in the background. Using peak detection electronics, we deduced this interpattern shift by measuring the distance between a reference and a test transition in a multibit pattern, with and without a background transition in the vicinity of the test transition. The measurement process was carefully designed to achieve high accuracy. We measured the proximity shift of a 3380‐type write head on disks with different remanent‐thickness product for cases of both easy and hard transition types for both the background and the data transitions. Results showed three distinct transition shift behavior depending on the background‐to‐test intertransition distance: a gradual decay in the far region (≳2 μm), a rapid rise in the intermediate region and asymptotic saturation at the near region when the two transitions are almost on top of each other. The asymptotic shift magnitude agre...