Disorder strongly enhances Auger recombination in conductive quantum-dot solids.
Disorder strongly enhances Auger recombination in conductive quantum-dot solids.
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DOI:
10.1038/ncomms3329
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发表时间:
2013
影响因子:
16.6
通讯作者:
Siebbeles LD
中科院分区:
文献类型:
--
作者:
Gao Y;Suchand Sandeep CS;Schins JM;Houtepen AJ;Siebbeles LD
Auger recombination (AR) can be an important loss mechanism for optoelectronic devices, but it is typically not very efficient at low excitation densities. Here we show that in conductive quantum-dot solids, AR is the dominant charge carrier decay path even at excitation densities as low as 10−3 per quantum dot, and that AR becomes faster as the charge carrier mobility increases. Monte Carlo simulations reveal that this efficient AR results from charge carrier congregation in ‘Auger hot spots’: lower-energy sites that are present because of energy disorder. Disorder-enhanced AR is a general effect that is expected to be active in all disordered materials. The observed efficient AR is an issue of concern for devices that work at charge carrier densities in excess of ~10−3 charge carriers per quantum dot. At the same time, efficient carrier congregation could be exploited for fast optical switching or to achieve optical gain in the near infrared. Understanding Auger recombination is important for building better optoelectronics, as it is a crucial loss mechanism. Gao et al. study it in conductive quantum dot solids, and find that it is the dominant charge carrier decay path, even for very low excitation densities.
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