High-Resolution Visualization and Compositional Analysis of Polymers with Atomic Force Microscopy
High-Resolution Visualization and Compositional Analysis of Polymers with Atomic Force Microscopy
复制标题
利用原子力显微镜对聚合物进行高分辨率可视化和成分分析
DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
S. Magonov
中科院分区：
文献类型：
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作者：
S. Magonov
原子力显微镜（AFM）在聚合物中的应用包括单个大分子的可视化，层状和微相形态的研究，以及使用相衬的异质材料的成分成像。高分辨率成像的基本问题，成分映射聚合物，AFM为基础的纳米压痕将被概述。多频AFM的最新发展影响了纳米力学和电学性质的局部研究，在振荡AFM模式下记录力曲线，以及单程开尔文力显微镜（KFM）和dC/dZ测量。最新的应用KFM和dC/dZ映射的非均相聚合物与极性组件将被提交。
Application of atomic force microscopy (AFM) to polymers includes visualization of single macromolecules, studies of lamellar and micro-phase morphologies, and compositional imaging of heterogeneous materials using phase contrast. The essential issues of high-resolution imaging, compositional mapping polymers, and AFM-based nanoindentation will be outlined. Recent developments in multi-frequency AFM impact local studies of nanomechanical and electric properties, the recording of force curves in oscillatory AFM modes, and single-pass Kelvin force microscopy (KFM) and dC/dZ measurements. The latest applications of KFM and dC/dZ mapping to heterogeneous polymers with polar components will be presented.